The Shared Research Facilities is exploring options to upgrade Scanning Electron Microscopy capabilities within the Electron Microscopy Facilities. To help decide on the best combination to address current and future research needs, the SRF is hosting different manufacturers to present their products and capabilities over the next few weeks.
For the third of the five planned presentations, representatives from Hitachi High Technologies America, Inc. will visit campus to present "Introduction to Broad and Focused Ion Beam Applications and Systems'' Monday, May 16, from noon-2:30 p.m in Room 105 White Hall. There will be tandem sessions on Materials and Biomedical Sciences.
The presentations can be attended in person or via MS Teams. Recordings may be made available upon request.